Nordson AXI XS Series AXI SMT X-ray Inspection Machine
Overview
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
Four In One - Advanced Technology
X-ray System Features
High speed AXI system with minimum footprint for inline setups
Microfocus / Submicron X-ray tube (sealed tube / maintenance free)
Resolution down to <1µm
Multiple programmable motion system with servo drives
Digital CMOS flatpanel detector
Automatic grey-level and geometrical calibration
Full product traceability via customized MES-Interface
Highlights
Same-side load/unload configuration
Barcode scanner for serial number and product type selection
Auto BCR scanning station (x-y gantry)
Low dose radiation filter
Available Configurations
Depending on the type of product & inspection task
SMT setup for component and solder-joint inspection on PCB, hybrid or chip level assembly processes
Semi-Backend setup for semiconductor applications, wire bond
Test (pre & post), light & complex PCB’s and flex circuits
XS-2 Transmission (2D) + SFT™
XS-2.5 Transmission (2D) + SFT™ + Off-Axis (2.5D)
XS-3 Transmission (2D) + SFT™ + Off-Axis (2.5D) + 3D SART
Applications
Inspection Technologies
The modular AXI system concept provides the unique capability to use several inspection technologies in one system. Depending on the specific application request the optimum inspection technique can be selected and/or combined.
2D Transmission
Transmission is two-dimensional image capturing with a fixed detector position
SFT Slice Filter Technique
High-speed technique using first side image to filter out from double-side image
2.5D-Oblique View
AXI on programmable angle-shots up to 40 dgr (used for high performance BGA and PTH inspection)
3D-SART
3D-Tomsynthesis to generate multiple horizontal slices used for high-dense double-sided and multi-chip-modules (MCM,LGA,…)
Specifications at a Glance
System | |
Footprint | 1760 mm (H) x 1300 mm (W) x 1600 (D) |
System Weight | 2.320 kg |
Power Consumption | Max. 6kW |
Line Voltage | 208 / 400 VAC, 50/60 Hz 3 phase, 24/16A |
Operation Temperature | 15° - 28° C optimal 20° - 25° C |
Air | 5-7 Bar, < 21/min, filtered (30μ), dry, oil free |
X-ray Inspection Setup | |
Off-Axis capability | |
Angle shot capability | up to 30 deg |
FoV range | |
Transmission FoV | 1.9 mm to 25 mm |
Standard setup | |
Max. sample size (W x L) | 200 mm x 250 mm - High Res. Setup |
150 mmx 250 mm - Ultra High Res. Setup | |
Min. sample size (W x L) | > 25 mm x 60 mm |
Max. inspection area (Transmission) | Same as max. sample size (please see above) |
Options | |
Automated Barcodereader station | |
Substrate handling setup with Magazine loader/ un-loader/laser maker | |
Top-clamp warpage compensation | |
Multiple HEPA filter configurations |