HIOKI FA1815-20 Flying Probe Tester

Number of test steps：Max. 4,000,000 steps
Judgment range：-99.9% to +999.9% or absolute value
Measurement speed：Max. 100 points/sec. (0.15 mm movements, 4-arm simultaneous probing, capacitance measurement)
Minimum pad pitch：Top surface: 34 μm (with CP1075-09) Bottom surface: 44 μm (with CP1075-09)

BASIC INFO

HIOKI FA1815-20 Flying Probe Tester

With remarkable progress in IT technology driving the semiconductor industry forward, reliability and productivity have become indispensable. Flying probe testers have long been the industry standard tool for PCB inspection. However, as inspection demands grow more stringent, the FA1815-20 emerges as the next-generation flying probe tester, ready to meet the challenges of precision and speed head-on. Moreover, this tester introduces an innovative approach to insulation resistance inspection that minimizes some cautious users’ concern about board damage with high-voltage testing in high-resistance inspections. This advancement represents Hioki's commitment to providing market-leading solutions that contribute to societal progress.

Unmatched probing precision: The FA1815-20 achieves a probing resolution with a minimum pitch of 34 µm between patterns and can inspect circuit test pads as small as 4 × 4 µm square. This precision is essential for today's increasingly fine circuit patterns.

Key Features

Improved takt time due to market-leading technology

High reliability due to high probing precision

Insulation testing up to 100 GΩ is enabled with an applied 10 V

Specifications Overview

Number of arms	4 (2 each, top and bottom)
Compatible probes	1172 series, CP1072 series, CP1073 series
Number of test steps	Max. 4,000,000 steps
Test parameters and measurement ranges	DC constant-current continuity measurement	400.0 mΩ to 1.000 kΩ
	DC constant-current resistance measurement	40.00 μΩ to 400.0 kΩ
	DC constant-voltage resistance measurement	4.000 Ω to 40.00 MΩ
	Insulation resistance measurement	1.000 kΩ to 100.0 GΩ
	Low voltage insulation resistance measurement	1.000 MΩ to 100.0 GΩ
	AC constant-voltage capacitance measurement	100.0 fF to 10.00 μF
	Leakage current measurement	1.000 μA to 100.0 mA
	High-voltage resistance measurement	1.000 kΩ to 100.0 GΩ
	Capacitor insulation measurement	1.000 kΩ to 250.0 MΩ
	Open measurement	4.000 Ω to 4.000 MΩ
	Short measurement	400.0 mΩ to 40.00 kΩ
Test parameters and measurement for component-embedded board tests	LSI connection test	0.000 V to 12.00 V
	AC constant-voltage resistance measurement	10.00 Ω to 10.00 kΩ
	AC constant-voltage capacitance measurement	10.00 pF to 100.0 μF
	AC constant-voltage inductance measurement	1.000 μH to 1.000 mH
Judgment range	-99.9% to +999.9% or absolute value
Movement resolution	XY: 0.1 μm/pulse; Z: 1 μm/pulse
Minimum pad pitch	Top surface: 34 μm (with CP1075-09)
	Bottom surface: 44 μm (with CP1075-09)
Minimum pad size	Top surface: 4 μm square (with CP1075-09)
	Bottom surface: 14 μm square (with CP1075-09)
Measurement speed	Max. 100 points/sec. (0.15 mm movements, 4-arm simultaneous probing, capacitance measurement)
Testable board size	Thickness : 1 mm (0.04 in.) to 12 mm (0.47 in.)
	Outer dimensions : 50 mm (1.97 in.) W × 50 mm (1.97 in.) D to 340 mm (13.39 in.) W × 340 mm (13.39 in.) D
Maximum testable area	340 mm (13.39 in.) W × 340 mm (13.39 in.) D
Clamp method	Flexible Fixture
	Vacuum Unit for Capacitance Test (Options)
Air requirements	Primary-side pressure: 0.5 MPa to 0.99 MPa (dry air)
	Maximum consumption: 0.3 L/min. (ANR)
Power supply	200 V, 220 V, 230 V, 240 V AC single-phase (specified at time of order);
	50/60 Hz; maximum power consumption: 5 kVA
Dimensions and weight	1355 mm (53.35 in.) W × 1190 mm (46.85 in.) H × 1265mm (49.8 in.) D(excluding protruding parts);
	1100 kg ±50 kg (38800 oz. ±1763 oz.)